TECHNOLOGY

Standard imaging devices such as CCD cameras only measure intensity and wavelength reflecting the strength and color of the light. The phase of light, whatever the radiation, from EUV to IR, cannot be registered by electronic cameras.


The phase adds a third dimension to conventional imaging devices, revealing key information:

  • 3D topography when light interacts with a reflecting object
  • Contrast, 3D structure and aberrations when light passes through low absorption or transparent samples
  • Light beam propagation parameters in direct sensing mode


Based on its patented Digital Wavefront Technology, PhaseView offers smart, direct, highly efficient solutions for simultaneous measurement of phase and intensity with outstanding resolution, using standard imaging detectors.


Digital Wavefront Technology relies on the law of intensity propagation, this law states relationship between phase and intensity during beam propagation. Variation of intensity along the propagation axis is governed by energy conservation principle, thus intensities differences are related to wavefront curvature. A set of two or more images recorded at different positions on the propagation axis allows to establish differential equations.


PhaseView has developed a combination of powerful and straightforward algorithm solving these equations and designed smart imaging platforms to fulfill the most demanding applications.


Direct Sensing Mode Intensity

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Wavefront
Beam Energy Distribution

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Beam Propagation
Beam Focusing
Beam Convergence & Divergence
Beam Propagation Parameters
Transmission Mode  
Defects Amplitude

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Aberrations (shape)
Refractive index
Sample thickness
Phase contrast
Reflection Mode  
Defects
Color & contrast
2D Measurements

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Sample topography (3D)
Reflected light aberrations
Key Benefits for Your Applications:
  • All-In-One imaging: Simultaneous acquisition of intensity and phase data
  • The highest wavefront resolution: measurement points directly related to imaging device resolution
  • Measurement principle independent of wavelength, detector related
  • Inherent cost effective solutions